Shared posts

16 Jun 14:21

Evaluation of different rectangular scan strategies for STEM imaging

Publication date: August 2020

Source: Ultramicroscopy, Volume 215

Author(s): A. Velazco, M. Nord, A. Béché, J. Verbeeck

25 Jul 10:23

Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM

Publication date: October 2018

Source: Micron, Volume 113

Author(s): Aakash Varambhia, Lewys Jones, Andrew London, Dogan Ozkaya, Peter D. Nellist, Sergio Lozano-Perez

Abstract

Spectroscopic signals such as EDS and EELS provide an effective way of characterising multi-element samples such as Pt-Co nanoparticles in STEM. The advantage of spectroscopy over imaging is the ability to decouple composition and mass-thickness effects for thin samples, into the number of various types of atoms in a sample. This is currently not possible for multi element samples using conventional ADF quantification techniques alone. With recent developments in microscope hardware and software, it is now possible to acquire the ADF, EDS and EELS signals simultaneously and at high speed. However, the methods of quantifying the signals emitted from the sample vary greatly. Most approaches use pure-element standards in the form of needles, nanoparticles and wedges to quantify the spectroscopic signal into either partial scattering cross-sections, zeta-factors or k-factors. But self-consistency between the different methods has not been verified and the units of the quantification are not standardised. We present a robust approach for measuring and combining ADF, EDS and EELS signals using needle and nanoparticle standards in units of the partial scattering cross-section. The partial scattering cross-section allows an easy interpretation of the signals emitted from the sample and enables accurate atom-counting of the sample.

25 Jul 10:13

Automatic segmentation of inorganic nanoparticles in BF TEM micrographs

Publication date: November 2018

Source: Ultramicroscopy, Volume 194

Author(s): D.J. Groom, K. Yu, S. Rasouli, J. Polarinakis, A.C. Bovik, P.J. Ferreira

Abstract

Transmission electron microscopy (TEM) represents a unique and powerful modality for capturing spatial features of nanoparticles, such as size and shape. However, poor statistics arise as a key obstacle, due to the challenge in accurately and automatically segmenting nanoparticles in TEM micrographs. Towards remedying this deficit, we introduce an automatic particle picking device that is based on the concept of variance hybridized mean local thresholding. Validation of this new segmentation model is accomplished by applying a program written in Matlab to a database of 150 bright field TEM micrographs containing approximately 2,000 nanoparticles. We compare the results to global thresholding, local thresholding, and manual segmentation. It is found that this novel automatic particle picking device reduces false positives and false negatives significantly, while increasing the number of individual particles picked on regions of particle overlap.

17 Jul 12:37

Surface distortion as a unifying concept and descriptor in oxygen reduction reaction electrocatalysis

by Raphaël Chattot

Surface distortion as a unifying concept and descriptor in oxygen reduction reaction electrocatalysis

Surface distortion as a unifying concept and descriptor in oxygen reduction reaction electrocatalysis, Published online: 16 July 2018; doi:10.1038/s41563-018-0133-2

Tuning surface structure is key for electrocatalytic performance and stability of proton-exchange membrane fuel cells. Surface distortion as a structural descriptor can help to clarify the role of surface defects and to design enhanced nanocatalysts.
02 Jul 15:57

Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM

Publication date: October 2018
Source:Micron, Volume 113
Author(s): Aakash Varambhia, Lewys Jones, Andrew London, Dogan Ozkaya, Peter D. Nellist, Sergio Lozano-Perez
Spectroscopic signals such as EDS and EELS provide an effective way of characterising multi-element samples such as Pt-Co nanoparticles in STEM. The advantage of spectroscopy over imaging is the ability to decouple composition and mass-thickness effects for thin samples, into the number of various types of atoms in a sample. This is currently not possible for multi element samples using conventional ADF quantification techniques alone. With recent developments in microscope hardware and software, it is now possible to acquire the ADF, EDS and EELS signals simultaneously and at high speed. However, the methods of quantifying the signals emitted from the sample vary greatly. Most approaches use pure-element standards in the form of needles, nanoparticles and wedges to quantify the spectroscopic signal into either partial scattering cross-sections, zeta-factors or k-factors. But self-consistency between the different methods has not been verified and the units of the quantification are not standardised. We present a robust approach for measuring and combining ADF, EDS and EELS signals using needle and nanoparticle standards in units of the partial scattering cross-section. The partial scattering cross-section allows an easy interpretation of the signals emitted from the sample and enables accurate atom-counting of the sample.

24 Apr 08:52

Exemplar-based inpainting as a solution to the missing wedge problem in electron tomography

Publication date: August 2018
Source:Ultramicroscopy, Volume 191
Author(s): Patrick Trampert, Wu Wang, Delei Chen, Raimond B.G. Ravelli, Tim Dahmen, Peter J. Peters, Christian Kübel, Philipp Slusallek
A new method for dealing with incomplete projection sets in electron tomography is proposed. The approach is inspired by exemplar-based inpainting techniques in image processing and heuristically generates data for missing projection directions. The method has been extended to work on three dimensional data. In general, electron tomography reconstructions suffer from elongation artifacts along the beam direction. These artifacts can be seen in the corresponding Fourier domain as a missing wedge. The new method synthetically generates projections for these missing directions with the help of a dictionary based approach that is able to convey both structure and texture at the same time. It constitutes a preprocessing step that can be combined with any tomographic reconstruction algorithm. The new algorithm was applied to phantom data, to a real electron tomography data set taken from a catalyst, as well as to a real dataset containing solely colloidal gold particles. Visually, the synthetic projections, reconstructions, and corresponding Fourier power spectra showed a decrease of the typical missing wedge artifacts. Quantitatively, the inpainting method is capable to reduce missing wedge artifacts and improves tomogram quality with respect to full width half maximum measurements.

06 Feb 16:50

Theory of the spatial resolution of (scanning) transmission electron microscopy in liquid water or ice layers

Publication date: April 2018
Source:Ultramicroscopy, Volume 187
Author(s): Niels de Jonge
The sample dependent spatial resolution was calculated for transmission electron microscopy (TEM) and scanning TEM (STEM) of objects (e.g., nanoparticles, proteins) embedded in a layer of liquid water or amorphous ice. The theoretical model includes elastic- and inelastic scattering, beam broadening, and chromatic aberration. Different contrast mechanisms were evaluated as function of the electron dose, the detection angle, and the sample configuration. It was found that the spatial resolution scales with the electron dose to the −1/4th power. Gold- and carbon nanoparticles were examined in the middle of water layers ranging from 0.01–-10 µm thickness representing relevant classes of experiments in both materials science and biology. The optimal microscope settings differ between experimental configurations. STEM performs the best for gold nanoparticles for all layer thicknesses, while carbon is best imaged with phase-contrast TEM for thin layers but bright field STEM is preferred for thicker layers. The resolution was also calculated for a water layer enclosed between thin membranes. The influence of chromatic aberration correction for TEM was examined as well. The theory is broadly applicable to other types of materials and sample configurations.

Graphical abstract

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15 May 15:58

Note on in situ (scanning) transmission electron microscopy study of liquid samples

Publication date: August 2017
Source:Ultramicroscopy, Volume 179
Author(s): Nan Jiang
Liquid cell (scanning) transmission electron microscopy has been developed rapidly, using amorphous SiNx membranes as electron transparent windows. The current interpretations of electron beam effects are mainly based on radiolytic processes. In this note, additional effects of the electric field due to electron-beam irradiation are discussed. The electric field can be produced by the charge accumulation due to the emission of secondary and Auger electrons. Besides various beam-induced phenomena, such as nanoparticle precipitation and gas bubble formation and motion, two other effects need to be considered; one is the change of Gibbs free energy of nucleation and the other is the violation of Brownian motion due to ion drifting driven by the electric field.

25 Oct 08:56

Quantitative EDXS: Influence of geometry on a four detector system

Publication date: January 2017
Source:Ultramicroscopy, Volume 172
Author(s): Johanna Kraxner, Margit Schäfer, Otto Röschel, Gerald Kothleitner, Georg Haberfehlner, Manuel Paller, Werner Grogger
The influence of the geometry on quantitative energy dispersive X-ray spectrometry (EDXS) analysis is determined for a ChemiSTEM system (Super-X) in combination with a low-background double-tilt specimen holder. For the first time a combination of experimental measurements with simulations is used to determine the positions of the individual detectors of a Super-X system. These positions allow us to calculate the detector's solid angles and estimate the amount of detector shadowing and its influence on quantitative EDXS analysis, including absorption correction using the ζ-factor method. Both shadowing by the brass portions and the beryllium specimen carrier of the holder severely affect the quantification of low to medium atomic number elements. A multi-detector system is discussed in terms of practical consequences of the described effects, and a quantitative evaluation of a Fayalit sample is demonstrated. Corrections and suggestions for minimizing systematic errors are discussed to improve quantitative methods for a multi-detector system.

25 Oct 08:54

Fabrication of thin TEM sample of ionic liquid for high-resolution ELNES measurements

Publication date: July 2017
Source:Ultramicroscopy, Volume 178
Author(s): Tomohiro Miyata, Teruyasu Mizoguchi
Investigation of the local structure, ionic and molecular behavior, and chemical reactions at high spatial resolutions in liquids has become increasingly important. Improvements in these areas help to develop efficient batteries and improve organic syntheses. Transmission electron microscopy (TEM) and scanning-TEM (STEM) have excellent spatial resolution, and the electron energy-loss near edge structure (ELNES) measured by the accompanied electron energy-loss spectroscopy (EELS) is effective to analyze the liquid local structure owing to reflecting the electronic density of states. In this study, we fabricate a liquid-layer-only sample with thickness of single to tens nanometers using an ionic liquid. Because the liquid film has a thickness much less than the inelastic mean free path (IMFP) of the electron beam, the fine structure of the C-K edge electron energy loss near edge structure (ELNES) can be measured with sufficient resolution to allow meaningful analysis. The ELNES spectrum from the thin liquid film has been interpreted using first principles ELNES calculations.

25 Oct 08:27

Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy

Publication date: May 2017
Source:Ultramicroscopy, Volume 176
Author(s): Z. Chen, D.J. Taplin, M. Weyland, L.J. Allen, S.D. Findlay
The increasing use of energy dispersive X-ray spectroscopy in atomic resolution scanning transmission electron microscopy invites the question of whether its success in precision composition determination at lower magnifications can be replicated in the atomic resolution regime. In this paper, we explore, through simulation, the prospects for composition measurement via the model system of Al x Ga 1 − x As , discussing the approximations used in the modelling, the variability in the signal due to changes in configuration at constant composition, and the ability to distinguish between different compositions. Results are presented in such a way that the number of X-ray counts, and thus the expected variation due to counting statistics, can be gauged for a range of operating conditions.

19 Oct 12:00

Revealing the heterogeneous contamination process in metal nanoparticulate catalysts in CO gas without purification by in situ environmental transmission electron microscopy

by Uchiyama, T., Yoshida, H., Kamiuchi, N., Kohno, H., Takeda, S.

This technical report reveals an issue surrounding environmental transmission electron microscopy. In CO gas of high pressure, a catalyst sample of inhomogeneous structure is partially contaminated without a gas purifier in the gas supply line.

11 Oct 15:00

Practical electron tomography guide: Recent progress and future opportunities

Publication date: December 2016
Source:Micron, Volume 91
Author(s): Misa Hayashida, Marek Malac
We present a review of the recent progress in electron tomography applicable to materials science samples. We focus on practical high accuracy tomographic measurements and their applications. We follow the steps leading to a reconstructed 3D volume and discuss the effect of the individual steps on the suitability of the resulting 3D volume for quantitative measurements. Both the progress in applications and new opportunities in electron tomography in materials science are reviewed.

26 Sep 15:37

Reverse Monte Carlo reconstruction algorithm for discrete electron tomography based on HAADF-STEM atom counting

by F. MOYON, D. HERNANDEZ-MALDONADO, M. D. ROBERTSON, A. ETIENNE, C. CASTRO, W. LEFEBVRE

Summary

In this paper, we propose an algorithm to obtain a three-dimensional reconstruction of a single nanoparticle based on the method of atom counting. The location of atoms in three dimensions has been successfully performed using simulations of high-angle-annular-dark-field images from only three zone-axis projections, [110], [310] and [211], for a face-centred cubic particle. These three orientations are typically accessible by low-tilt holders often used in high-performance scanning transmission electron microscopes.

Lay description

Looking at objects and being able to count the atoms constituting it is a challenging task for materials scientists. Electron microscopists are now using scanning transmission electron microscopes (STEM) of outstanding capabilities and have developed statistical methods allowing atom counting in nano-objects from their 2D-projections. However, retrieving the 3D morphology of an object from few projections is not a trivial issue. This is even more difficult when the microscope configuration does not allow projecting the nano-object along very distinct orientations. Such an approach, designated as “discrete tomography”, has demonstrated very strong capabilities in the last 5 years. Nevertheless, no detailed reconstruction algorithm has ever been published for discrete tomography performed in STEM. In addition, no study has been published which actually demonstrates the accuracy of the method based on its application to simulated data. In the present work, we present the details of a discrete tomography reconstruction algorithm which is applied to simulated projections of a nanoparticle. The choice of the projection angles has been done to reproduce the unfavorable conditions encountered in many STEM instruments, for which large specimen tilt capabilities are not accessible. Based on three close projections, it is demonstrated that a very satisfying and faithful reconstruction of the nanoparticle can be reached.

13 Sep 09:41

Anisotropic phase segregation and migration of Pt in nanocrystals en route to nanoframe catalysts

by Zhiqiang Niu

Nature Materials. doi:10.1038/nmat4724

Authors: Zhiqiang Niu, Nigel Becknell, Yi Yu, Dohyung Kim, Chen Chen, Nikolay Kornienko, Gabor A. Somorjai & Peidong Yang

09 Sep 13:16

Two-dimensional gallium nitride realized via graphene encapsulation

by Zakaria Y. Al Balushi

Nature Materials. doi:10.1038/nmat4742

Authors: Zakaria Y. Al Balushi, Ke Wang, Ram Krishna Ghosh, Rafael A. Vilá, Sarah M. Eichfeld, Joshua D. Caldwell, Xiaoye Qin, Yu-Chuan Lin, Paul A. DeSario, Greg Stone, Shruti Subramanian, Dennis F. Paul, Robert M. Wallace, Suman Datta, Joan M. Redwing & Joshua A. Robinson

The spectrum of two-dimensional (2D) and layered materials ‘beyond graphene’ offers a remarkable platform to study new phenomena in condensed matter physics. Among these materials, layered hexagonal boron nitride (hBN), with its wide bandgap energy (∼5.0–6.0 eV), has clearly established that 2D nitrides are key to advancing 2D devices. A gap, however, remains between the theoretical prediction of 2D nitrides ‘beyond hBN’ and experimental realization of such structures. Here we demonstrate the synthesis of 2D gallium nitride (GaN) via a migration-enhanced encapsulated growth (MEEG) technique utilizing epitaxial graphene. We theoretically predict and experimentally validate that the atomic structure of 2D GaN grown via MEEG is notably different from reported theory. Moreover, we establish that graphene plays a critical role in stabilizing the direct-bandgap (nearly 5.0 eV), 2D buckled structure. Our results provide a foundation for discovery and stabilization of 2D nitrides that are difficult to prepare via traditional synthesis.

08 Sep 11:51

Scanning electron microscopy image representativeness: morphological data on nanoparticles

by KATARZYNA ODZIOMEK, DANIELA USHIZIMA, PRZEMYSLAW OBERBEK, KRZYSZTOF JAN KURZYDŁOWSKI, TOMASZ PUZYN, MACIEJ HARANCZYK

Summary

A sample of a nanomaterial contains a distribution of nanoparticles of various shapes and/or sizes. A scanning electron microscopy image of such a sample often captures only a fragment of the morphological variety present in the sample. In order to quantitatively analyse the sample using scanning electron microscope digital images, and, in particular, to derive numerical representations of the sample morphology, image content has to be assessed. In this work, we present a framework for extracting morphological information contained in scanning electron microscopy images using computer vision algorithms, and for converting them into numerical particle descriptors. We explore the concept of image representativeness and provide a set of protocols for selecting optimal scanning electron microscopy images as well as determining the smallest representative image set for each of the morphological features. We demonstrate the practical aspects of our methodology by investigating tricalcium phosphate, Ca3(PO4)2, and calcium hydroxyphosphate, Ca5(PO4)3(OH), both naturally occurring minerals with a wide range of biomedical applications.

Lay description

A typical sample of a nanomaterial contains a distribution of nanoparticles of various shapes and/or sizes. A single scanning electron microscopy (SEM) image of such a sample often captures only a fragment of the sample, and therefore only a fragment of the morphological variety present in the sample. In order to obtain more complete information about the "true" sample morphology, one needs to asses the content of a series of SEM images. In our article, we present a framework for extracting morphological information contained in SEM images using computer vision algorithms, and for converting them into numerical particle descriptors representing the particle morphology. We then explore the concept of image representativeness and provide a set of protocols for selecting optimal SEM images as well as determining the smallest representative image set for each of the morphological features. We demonstrate the practical aspects of our methodology by investigating SEM images of a tricalcium phosphate sample, a naturally occurring mineral with a wide range of biomedical applications.

22 Aug 13:52

Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy

Publication date: December 2016
Source:Ultramicroscopy, Volume 171
Author(s): J.H. Dycus, W. Xu, X. Sang, A.J. D'Alfonso, Z. Chen, M. Weyland, L.J. Allen, S.D. Findlay, J.M. LeBeau
Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis.

09 Aug 10:59

ZnSe nanostructures: Synthesis, properties and applications

Publication date: October 2016
Source:Progress in Materials Science, Volume 83
Author(s): Qi Zhang, Huiqiao Li, Ying Ma, Tianyou Zhai
As an important II–VI semiconductor, ZnSe is one of the first semiconductors discovered and is probably one of the most important electronic and optoelectronic materials with prominent applications in nonlinear optical devices, flat panel displays, light emitting diodes, lasers, logic gates, transistors, etc. In this article, we will provide a comprehensive review of the state-of-the-art research activities that focus on the rational synthesis, novel properties and unique applications of ZnSe nanostructures. We begin with a historical background of ZnSe, description of its structure, chemical and electronic properties, and its unique advantages in specific potential applications. This is followed by a survey of ZnSe nanostructures with various morphologies and their corresponding synthesis methods. Using various facile methods or techniques, nanoparticles, nanowires, nanobelts/nanoribbons, nanosheets, nanotubes, core/shell nanostructures, hierarchical nanostructures and heterostructures of ZnSe have been synthesized under specific growth conditions so far. Then, we discuss the critical experiments determining the optical and electrical properties of the nanostructures, as crucially they changes with synthetic conditions. Next, we highlight the recent achievements regarding to the potential applications of ZnSe nanostructures in light emitting diodes (LEDs), lasers, field emitters, photodetectors, sensors, photocatalysis, solar cells, vivo imaging, and so on. Finally, we conclude this review with some perspectives and outlook on the future developments in this area. Overall, this comprehensive review presents a systematic investigation on the controlled synthesis, novel properties and advanced applications of ZnSe nanostructures.

08 Aug 09:12

Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization

Publication date: November 2016
Source:Ultramicroscopy, Volume 170
Author(s): Motoki Shiga, Kazuyoshi Tatsumi, Shunsuke Muto, Koji Tsuda, Yuta Yamamoto, Toshiyuki Mori, Takayoshi Tanji
Advances in scanning transmission electron microscopy (STEM) techniques have enabled us to automatically obtain electron energy-loss (EELS)/energy-dispersive X-ray (EDX) spectral datasets from a specified region of interest (ROI) at an arbitrary step width, called spectral imaging (SI). Instead of manually identifying the potential constituent chemical components from the ROI and determining the chemical state of each spectral component from the SI data stored in a huge three-dimensional matrix, it is more effective and efficient to use a statistical approach for the automatic resolution and extraction of the underlying chemical components. Among many different statistical approaches, we adopt a non-negative matrix factorization (NMF) technique, mainly because of the natural assumption of non-negative values in the spectra and cardinalities of chemical components, which are always positive in actual data. This paper proposes a new NMF model with two penalty terms: (i) an automatic relevance determination (ARD) prior, which optimizes the number of components, and (ii) a soft orthogonal constraint, which clearly resolves each spectrum component. For the factorization, we further propose a fast optimization algorithm based on hierarchical alternating least-squares. Numerical experiments using both phantom and real STEM-EDX/EELS SI datasets demonstrate that the ARD prior successfully identifies the correct number of physically meaningful components. The soft orthogonal constraint is also shown to be effective, particularly for STEM-EELS SI data, where neither the spatial nor spectral entries in the matrices are sparse.

08 Aug 09:11

Current status and future directions for in situ transmission electron microscopy

Publication date: November 2016
Source:Ultramicroscopy, Volume 170
Author(s): Mitra L. Taheri, Eric A. Stach, Ilke Arslan, P.A. Crozier, Bernd C. Kabius, Thomas LaGrange, Andrew M. Minor, Seiji Takeda, Mihaela Tanase, Jakob B. Wagner, Renu Sharma
This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.

07 Jul 09:01

Polyvinylpyrrolidone-induced anisotropic growth of gold nanoprisms in plasmon-driven synthesis

by Yueming Zhai

Nature Materials. doi:10.1038/nmat4683

Authors: Yueming Zhai, Joseph S. DuChene, Yi-Chung Wang, Jingjing Qiu, Aaron C. Johnston-Peck, Bo You, Wenxiao Guo, Benedetto DiCiaccio, Kun Qian, Evan W. Zhao, Frances Ooi, Dehong Hu, Dong Su, Eric A. Stach, Zihua Zhu & Wei David Wei

29 Jun 08:51

Detection of water and its derivatives on individual nanoparticles using vibrational electron energy-loss spectroscopy

Publication date: October 2016
Source:Ultramicroscopy, Volume 169
Author(s): Peter A. Crozier, Toshihiro Aoki, Qianlang Liu
Understanding the role of water, hydrate and hydroxyl species on nanoparticle surfaces and interfaces is very important in both physical and life sciences. Detecting the presence of oxygen-hydrogen species with nanometer resolution is extremely challenging at present. Here we show that the recently developed vibrational electron energy-loss spectroscopy using subnanometer focused electron beams can be employed to spectroscopically identify the local presence and variation of OH species on nanoscale surfaces. The hydrogen-oxygen fingerprint can be correlated with highly localized structural and morphological information obtained from electron imaging. Moreover, the current approach exploits the aloof beam mode of spectral acquisition which does not require direct electron irradiation of the sample thus greatly reducing beam damage to the OH bond. These findings open the door for using electron microscopy to probe local hydroxyl and hydrate species on nanoscale organic and inorganic structures.

16 Jun 16:30

Qualitative and quantitative interpretation of SEM image using digital image processing

by DAWID SALADRA, MAGDALENA KOPERNIK

Summary

The aim of the this study is improvement of qualitative and quantitative analysis of scanning electron microscope micrographs by development of computer program, which enables automatic crack analysis of scanning electron microscopy (SEM) micrographs. Micromechanical tests of pneumatic ventricular assist devices result in a large number of micrographs. Therefore, the analysis must be automatic. Tests for athrombogenic titanium nitride/gold coatings deposited on polymeric substrates (Bionate II) are performed. These tests include microshear, microtension and fatigue analysis. Anisotropic surface defects observed in the SEM micrographs require support for qualitative and quantitative interpretation. Improvement of qualitative analysis of scanning electron microscope images was achieved by a set of computational tools that includes binarization, simplified expanding, expanding, simple image statistic thresholding, the filters Laplacian 1, and Laplacian 2, Otsu and reverse binarization. Several modifications of the known image processing techniques and combinations of the selected image processing techniques were applied. The introduced quantitative analysis of digital scanning electron microscope images enables computation of stereological parameters such as area, crack angle, crack length, and total crack length per unit area. This study also compares the functionality of the developed computer program of digital image processing with existing applications. The described pre- and postprocessing may be helpful in scanning electron microscopy and transmission electron microscopy surface investigations.

Lay description

Micrographs of scanning electron microscopy obtained from micromechanical tests performed for athrombogenic titanium nitride/gold coatings deposited on polymeric substrates applied in pneumatic ventricular assist devices are present in large numbers due to a multistage character of the micromechanical testing. Anisotropic surface defects observed in the SEM micrographs require support for qualitative and quantitative interpretation. Improvement of qualitative analysis of scanning electron microscope results was proposed by a computer program for image processing, which uses image processing algorithms. Authors proposed several modifications of the known image processing techniques and also applied combinations of the selected image processing techniques. Introduced quantitative analysis of digital scanning electron microscope results enables computation of the selected stereological parameters. The study also compares the functionality of developed computer program of digital image processing with existing applications.

15 Jun 08:52

Crystal symmetry breaking and vacancies in colloidal lead chalcogenide quantum dots

by Federica Bertolotti

Nature Materials. doi:10.1038/nmat4661

Authors: Federica Bertolotti, Dmitry N. Dirin, Maria Ibáñez, Frank Krumeich, Antonio Cervellino, Ruggero Frison, Oleksandr Voznyy, Edward H. Sargent, Maksym V. Kovalenko, Antonietta Guagliardi & Norberto Masciocchi

26 May 12:51

Cluster Plasmonics: Dielectric and Shape Effects on DNA-Stabilized Silver Clusters

by Stacy M. Copp, Danielle Schultz, Steven M. Swasey, Alexis Faris and Elisabeth G. Gwinn

TOC Graphic

Nano Letters
DOI: 10.1021/acs.nanolett.6b00723
25 May 11:00

Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy

Publication date: September 2016
Source:Ultramicroscopy, Volume 168
Author(s): Z. Chen, M. Weyland, X. Sang, W. Xu, J.H. Dycus, J.M. LeBeau, A.J. D'Alfonso, L.J. Allen, S.D. Findlay
Quantitative agreement on an absolute scale is demonstrated between experiment and simulation for two-dimensional, atomic-resolution elemental mapping via energy dispersive X-ray spectroscopy. This requires all experimental parameters to be carefully characterized. The agreement is good, but some discrepancies remain. The most likely contributing factors are identified and discussed. Previous predictions that increasing the probe forming aperture helps to suppress the channelling enhancement in the average signal are confirmed experimentally. It is emphasized that simple column-by-column analysis requires a choice of sample thickness that compromises between being thick enough to yield a good signal-to-noise ratio while being thin enough that the overwhelming majority of the EDX signal derives from the column on which the probe is placed, despite strong electron scattering effects.

18 May 09:06

Evaluation of neon focused ion beam milling for TEM sample preparation

by T.C. PEKIN, F.I. ALLEN, A.M. MINOR

Summary

Gallium-based focused ion beams generated from liquid–metal sources are widely used in micromachining and sample preparation for transmission electron microscopy, with well-known drawbacks such as sample damage and contamination. In this work, an alternative (neon) focused ion beam generated by a gas field-ionization source is evaluated for the preparation of electron-transparent specimens. To do so, electron-transparent sections of Si and an Al alloy are prepared with both Ga and Ne ion beams for direct comparison. Diffraction-contrast imaging and energy dispersive x-ray spectroscopy are used to evaluate the relative damage induced by the two beams, and cross-sections of milled trenches are examined to compare the implantation depth with theoretical predictions from Monte Carlo simulations. Our results show that for the beam voltages and materials systems investigated, Ne ion beam milling does not significantly reduce the focused ion beam induced artefacts. However, the Ne ion beam does enable more precise milling and may be of interest in cases where Ga contamination cannot be tolerated.

Lay description

Transmission electron microscopy (TEM) is an extremely powerful tool used to examine the smallest objects imaginable, down to single atoms. This is increasingly relevant in many fields, such as semiconductor devices, which are always shrinking, and materials science, where nanostructure materials offer unique properties not previously achievable. TEM analysis relies on an extremely thin sample, often thinner than 100 nm, and producing a representative sample without artefacts from the sample preparation itself is often a concern. One of the most useful techniques in obtaining a thin sample is gallium focused ion beam machining, analogous to controlled sand blasting, but using gallium ions instead of sand particles. The beam of ions used can be manipulated to intensely remove material from a spot, or a large area by rastering the beam across the defined pattern. With careful application of the focused ion beam, extremely thin samples suitable for TEM can be made from site-specific areas from heterogeneous samples. In this paper, a new ion species (neon) is examined for its suitability in ion milling. This ion beam removes material more slowly, but can offer better resolution and control of the milling pattern. Several experiments were performed to evaluate the efficacy of this new method, with the conclusion that it produces similar artefacts, but can be an alternative to gallium-based milling in situations that require it, which include samples that are contaminated by gallium, or when extremely high precision milling is required.

06 May 10:12

Multiscale imaging and characterization of the effect of mixing temperature on asphalt concrete containing recycled components

by M.C. CAVALLI, M. GRIFFA, S. BRESSI, M.N. PARTL, G. TEBALDI, L.D. POULIKAKOS

Summary

When producing asphalt concrete mixture with high amounts of reclaimed asphalt pavement (RAP), the mixing temperature plays a significant role in the resulting spatial distribution of the components as well as on the quality of the resulting mixture, in terms of workability during mixing and compaction as well as in service mechanical properties. Asphalt concrete containing 50% RAP was investigated at mixing temperatures of 140, 160 and 180°C, using a multiscale approach. At the microscale, using energy dispersive X-ray spectroscopy the RAP binder film thickness was visualized and measured. It was shown that at higher mixing temperatures this film thickness was reduced. The reduction in film thickness can be attributed to the loss of volatiles as well as the mixing of RAP binder with virgin binder at higher temperatures. X-ray computer tomography was used to characterize statistically the distribution of the RAP and virgin aggregates geometric features: volume, width and shape anisotropy. In addition using X-ray computer tomography, the packing and spatial distribution of the RAP and virgin aggregates was characterized using the nearest neighbour metric. It was shown that mixing temperature may have a positive effect on the spatial distribution of the aggregates but did not affect the packing. The study shows a tendency for the RAP aggregates to be more likely distributed in clusters at lower mixing temperatures. At higher temperatures, they were more homogeneously distributed. This indicates a higher degree of blending both at microscale (binder film) and macroscale (spatial distribution) between RAP and virgin aggregates as a result of increasing mixing temperatures and the ability to quantify this using various imaging techniques.

Lay description

Recycling of asphalt concrete is a result of combining reclaimed asphalt pavement (RAP) with virgin aggregates and virgin binder. The mixing temperature of RAPand virgin materials and the resulting distribution of the components have a significant effect on the quality of the mixture. In this study, asphalt concrete containing 50% RAP was investigated at mixing temperatures of 140, 160 and 180°C, using a multiscale approach. At the microscale the RAP binder film thickness was visualized and measured. It was shown that at higher mixing temperatures this film thickness was reduced. The reduction in film thickness can be attributed to the loss of volatiles as well as the mixing of RAP binder with virgin binder at higher temperatures. X-Ray computer tomography was used to characterize the RAP and virgin aggregates’ geometric features: volume, width and shape anisotropy. In addition using X-ray computer tomography, the packing and spatial distribution of the RAP and virgin aggregates was characterized. It was shown that mixing temperature had a positive effect on the spatial distribution of the aggregates but did not affect the packing. The study shows a tendency for the RAP aggregates to be more likely grouped into clusters at lower mixing temperatures. At higher temperatures, they were more homogeneously distributed. This result indicates a higher degree of blending both at microscale (binder film) and macro scale (spatial distribution) between RAP and virgin aggregates as a result of increasing mixing temperatures and the ability to quantify this using various imaging techniques.

03 May 14:25

The Effect of Electron Beam Irradiation in Environmental Scanning Transmission Electron Microscopy of Whole Cells in Liquid

Research Articles
Justus Hermannsdörfer, Verena Tinnemann, Diana B. Peckys, Niels de Jonge
Microscopy and Microanalysis,FirstView Article(s), 10 pages

Abstract
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